Gel capacitor edge margin reduction using robust dielectric materials

Chase Kayser1,2

  1. Sandia National Laboratories
  2. University of New Mexico

High-voltage Mylar capacitors are typically manufactured with a substantial edge margin to prevent failure at the electrode edges. By filling this void with a strong dielectric material, the edge margin can in principle be reduced, improving the reliability and performance of the devices. This study assesses the suitability of two solution-processed dielectric materials, polystyrene and polyester, for edge margin reduction. Samples are fabricated with a planar structure to test the dielectric breakdown of the coated polymers. The effects of the insulating material, processing methods, and sample geometry on dielectric breakdown will be discussed, suggesting a promising route to reduce the capacitor edge margin.

Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525.